Non-contact measuring device - Company Ranking(4 companyies in total)

Last Updated：Aug 13, 2025 Aggregation Period:Jul 16, 2025〜Aug 12, 2025
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Company Name	Company information	Featured Products
Company Name	Company information	Product Image, Product Name, Price Range	overview	Application/Performance example
日本セミラボ新横浜本社	Address Kanagawa/ Business Activities ■Import and sales of semiconductor measurement devices and provision of technical services ■We handle the following products: Spectroscopic Ellipsometer Non-contact Sheet Resistance Measurement Device DLTS Measurement System Nano Indenter AFM (Atomic Force Microscope) Carrier Mobility Measurement Device Non-contact CV Measurement Device Lifetime Measurement Device Photoluminescence Please feel free to contact us for device specifications and pricing information. Key Partners Semiconductor Solar cell Manufacturing companies such as FPD Research institutions	Non-contact CV measurement device Cn0CV Other	【Features】 ■ Non-contact CV/IV inline measurement ■ Ultra-high sensitivity contamination management (E8 level iron concentration measurement) ■ Pattern monitor measurement available (SL model) ■ PDM 【Main Measurement and Evaluation Items】 ■ Contamination management - Diffusion length measurement by DSPV - Iron concentration measurement (E8 level) ■ Film evaluation - Electrical film thickness (CET/EOT) - Flat band voltage (VFB) - Interface state density (Dit) measurement - Leak IV measurement - Epi resistivity measurement - High-k evaluation - Low-k evaluation	■Contamination Management - Diffusion length measurement by DSPV - Iron concentration measurement (E8 level) ■Film Evaluation - Electrical film thickness (CET/EOT) - Flat band voltage (VFB) - Measurement of interface states (Dit) - Leakage IV measurement - Epi resistivity measurement - High-k evaluation - Low-k evaluation
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日本セミラボ新横浜本社

Address

Kanagawa/

Business Activities

■Import and sales of semiconductor measurement devices and provision of technical services ■We handle the following products: Spectroscopic Ellipsometer Non-contact Sheet Resistance Measurement Device DLTS Measurement System Nano Indenter AFM (Atomic Force Microscope) Carrier Mobility Measurement Device Non-contact CV Measurement Device Lifetime Measurement Device Photoluminescence Please feel free to contact us for device specifications and pricing information.

Key Partners

Semiconductor Solar cell Manufacturing companies such as FPD Research institutions

Featured Products

Non-contact CV measurement device Cn0CV

overview

【Features】 ■ Non-contact CV/IV inline measurement ■ Ultra-high sensitivity contamination management (E8 level iron concentration measurement) ■ Pattern monitor measurement available (SL model) ■ PDM 【Main Measurement and Evaluation Items】 ■ Contamination management - Diffusion length measurement by DSPV - Iron concentration measurement (E8 level) ■ Film evaluation - Electrical film thickness (CET/EOT) - Flat band voltage (VFB) - Interface state density (Dit) measurement - Leak IV measurement - Epi resistivity measurement - High-k evaluation - Low-k evaluation

Application/Performance example

■Contamination Management - Diffusion length measurement by DSPV - Iron concentration measurement (E8 level) ■Film Evaluation - Electrical film thickness (CET/EOT) - Flat band voltage (VFB) - Measurement of interface states (Dit) - Leakage IV measurement - Epi resistivity measurement - High-k evaluation - Low-k evaluation
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Non-contact measuring device - Company Ranking(4 companyies in total)

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